The center possesses unique, complementary and state-of-the art equipment for computed tomography (XCT), X-ray phase contrast imaging, X-ray diffraction (thin film and powder XRD, single crystal XRD), small angle X-ray scattering (SAXS) and extended software tools for 3D image analysis and simulations.

Based on synergies and close collaborations with other centers and research laboratories at Empa, the Center for X-ray Analytics contributes to high-impact research in the field of materials science and biotechnology.

Prof. Dr. Antonia Neels
Head of the Center for X-ray Analytics

Phone: +41 58 765 4507