Publications TOF-SIMS and TOFMS


  1. A. Priebe, B. Dousse, Ch.-Y. Tzou, G. Papadopoulos, I. Utke, A. Bensaoula, J. Michler, C. Guerra-Nuñez
    "Real-Time In Situ Parallel Detection Of Elements And Molecules With TOFMS During ALD For Chemical Quality Control Of Thin Films"
    The Journal of Physical Chemistry C (2022)


  1. R. Dubey, J. Sastre, C. Cancellieri, F. Okur, A. Forster, L. Pompizii, A. Priebe, Y. Romanyuk, L. P.H. Jeurgens, M. V. Kovalenko, K. V. Kravchyk
    "Building a Better Garnet-Type Solid Electrolyte/Metallic Li Interface with Antimony"
    Advanced Energy Materials, Vol. 11, pp. 2102086 (2021)

  2. A. Priebe, J. Sastre, M. H. Futscher, J. Jurczyk, M. V. Puydinger dos Santos, Y. E. Romanyuk, J. Michler
    "Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries"
    ACS Applied Materials & Interfaces, Vol. 13, pp. 41262–41274 (2021)

  3. A. Priebe, E. Huszar, M. Nowicki, L. Pethö, J. Michler
    "Mechanisms of Fluorine-Induced Separation of Mass Interference during TOF-SIMS Analysis"
    Analytical Chemistry, Vol. 93, pp. 10261–10271 (2021)
  4. J. Sastre, M. H. Futscher, L. Pompizi, A. Aribia, A. Priebe, J. Overbeck, M. Stiefel, A. N. Tiwari, Y. E. Romanyuk
    "Blocking lithium dendrite growth in solid-state batteries with an ultrathin amorphous Li-La-Zr-O solid electrolyte"
    Communications Materials, Vol. 2, pp. 1–10 (2021)
  5. A. Priebe, L. Pethö, E. Huszar, T. Xie, I. Utke, J. Michler
    "High Sensitivity of Fluorine Gas-Assisted FIB-TOF-SIMS for Chemical Characterization of Buried Sublayers in Thin Films"
    ACS Applied Materials & Interfaces, Vol.13, pp. 15890–15900  (2021)
  6. K. Wieczerzak, A. Priebe, I. Utke, J. Michler
    "Practical Aspects of Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Analysis Enhanced by Fluorine Gas Coinjection"
    Chemistry of Materials, Vol. 33, 1581–1593 (2021)
  7. L. Pillatsch, S. Kalácska, X. Maeder, J. Michler
    "In Situ Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, Oxidation"
    Microscopy and Microanalysis, Vol. 27, pp. 65 - 73 (2021)


  1. A. Priebe, T. Xie, L. Pethö, J. Michler
    "Potential of gas-assisted time-of-flight secondary ion mass spectrometry for improving elemental characterization of complex metal-based systems"
    Journal of Analytical Atomic Spectrometry, Vol. 35, pp. 2997-3006 (2020)!divAbstract
  2. A. Priebe, J.-P. Barnes, T. Edwards, E. Huszár, L. Pethö, J. Michler
    "Elemental characterization of Al nanoparticles buried under a Cu thin film – TOF-SIMS vs. STEM/EDX"
    Analytical Chemistry, Vol. 92, pp. 12518-12527 (2020)
  3. J. Sastre, A. Priebe, M. Döbeli, J. Michler, A. N. Tiwari, Y. E. Romanyuk
    "Lithium Garnet Li7La3Zr2O12 Electrolyte for All‐Solid‐State Batteries: Closing the Gap between Bulk and Thin Film Li‐Ion Conductivities"
    Advanced Materials Interfaces, Vol. 7, pp. 2000425 (2020)
  4. A. Priebe,   T. Xie,   G. Bürki,   L. Pethö,  J. Michler
    "Matrix effect in TOF-SIMS analysis of two-element inorganic thin films"
    Journal of Analytical Atomic Spectrometry, Vol. 35, pp. 1156-1166 (2020)!divAbstract
  5. A. Priebe, L. Pethö, J. Michler
    "Fluorine gas coinjection as a solution for enhancing spatial resolution of time-of-flight secondary ion mass spectrometry and separating mass interference"
    Analytical Chemistry, Vol. 92, pp. 2121-2129 (2020)


  1. A. Priebe, I. Utke, L. Pethö, J. Michler
    "Application of a gas-injection system during the FIB-TOF-SIMS analysis - influence of water and fluorine gases on secondary ion signals and sputtering rates"
    Analytical Chemistry, Vol. 91, pp. 11712 - 11722 (2019)
  2. A. Priebe, J.-P. Barnes, T. E. J. Edwards, L. Pethö, I. Balogh, J. Michler
    "3D imaging of nanoparticles in an inorganic matrix using TOF-SIMS validated with STEM and EDX"
    Analytical Chemistry, Vol. 91, pp. 11834 - 11839 (2019)
  3. J. Sastre, T.-Y. Lin, A. N. Filippin, A. Priebe, E. Avancini, J. Michler, A. N. Tiwari, Y. E. Romanyuk, S. Buecheler
    "Aluminum-Assisted Densification of Co-Sputtered Lithium Garnet Electrolyte Films for Solid-State Batteries"
    ACS Applied Energy Materials, Vol. 2, pp. 8511-8524 (2019)
  4. L. Pillatsch, F. Östlund, J. Michler
    "FIBSIMS: A review of secondary ion mass spectrometry for analytical dual beam focussed ion beam instruments"
    Progress in Crystal Growth and Characterization of Materials, Vol. 65, pp. 1-19 (2019)
  5. A. Priebe, J. Michler
    "Application of a novel compact Cs evaporator prototype for enhancing negative ion yields during FIB-TOF-SIMS analysis in high vacuum"
    Ultramicroscopy, Vol. 196, pp.10-17 (2019)
  6. Ch. Jiao, L. Pillatsch, J. Mulders, D. Wall
    "Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry and DualBeam FIB/SEM Imaging of Lithium-ion Battery Cathode"
    Microscopy and Microanalysis, Vol. 25(S2), pp. 876-877 (2019)


  1. E. Avancini, D. Keller, R. Carron, Y. Arroyo-Rojas Dasilva, R. Erni, A. Priebe, S. Di Napoli, M. Carrisi, G. Sozzi, R. Menozzi, F. Fu, S. Buecheler, A. N. Tiwari
    "Voids and compositional inhomogeneities in Cu(In,Ga)Se2 thin films: evolution during growth and impact on solar cell performance"
    Science and Technology of Advanced Materials, Vol. 19, No. 1, pp. 871-882 (2018)


  1. M. Bärtsch, M. Sarnowska, O. Krysiak, Ch. Willa, Ch. Huber, L. Pillatsch, S. Reinhard, M. Niederberger
    "Multicomposite Nanostructured Hematite–Titania Photoanodes with Improved Oxygen Evolution: The Role of the Oxygen Evolution Catalyst"
    ACS Omega, Vol. 2, pp. 4531-4539 (2017)


  1. I. Shorubalko, L. Pillatsch, I. Utke
    "Direct–Write Milling and Deposition with Noble Gases", in: G. Hlawacek, A. Gölzhäuser (eds) "Helium Ion Microscopy. NanoScience and Technology"
    Springer, Cham (2016)


  1. D. Alberts, L. von Werra, F. Oestlund, U. Rohner, M. Hohl, J. Michler, J. A. Whitby
    "Design and performance of two orthogonal extraction time-of-flight secondary ion mass spectrometers for focused ion beam instruments"
    Instrumentation Science & Technology, Vol.  42, pp. 432-445 (2014)


  1. J. A. Whitby, F. Östlund, P. Horvath, M. Gabureac, J. L. Riesterer, I. Utke, M. Hohl, L. Sedláček, J. Jiruše, V. Friedli, M. Bechelany, J. Michler
    "High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with In Situ AFM"
    Advances in Materials Science and Engineering, Vol. 2012, pp. 1-13 (2012)